Subwavelength optical microscopy in the far field
Author(s): Sun, QQ (Sun, Qingqing); Al-Amri, M (Al-Amri, M.); Scully, MO (Scully, Marlan O.); Zubairy, MS (Zubairy, M. Suhail)
We present a procedure for subwavelength optical microscopy. The identical atoms are distributed on a plane and shined with a standing wave. We rotate the plane to different angles and record the resonant fluorescence spectra in the far field, from which we can obtain their distance and location information. This procedure also works for atomic separation above one wavelength and therefore provides a seamless microscopy.
Source: PHYSICAL REVIEW A 83(6): Art. No. 063818 JUN 16 2011